Ключевые слова: coated conductors, fabrication, MOD process, cap layers, manganites, buffer layers, critical caracteristics, X-ray diffraction, roughness, surface, lattice parameter, critical current density, temperature dependence, microstructure, critical current, distribution, experimental results, HTS, YBCO
Ключевые слова: HTS, YBCO, thin films, fabrication, MOD process, fluorine-free process, sintering, precursors, substrate LaAlO3, X-ray diffraction, microstructure, resistance, temperature dependence
Ключевые слова: doping effect, pinning centers, lattice parameter, mechanical properties, strain effects, nanoscaled effects, X-ray diffraction, thin films, substrate LaAlO3, MOD process, microstructure, critical caracteristics, Jc/B curves, pinning force, fabrication, experimental results, HTS, YBCO
Ключевые слова: HTS, YGdBCO, TFA-MOD process, films, substrate LaAlO3, X-ray diffraction, microstructure, composition, critical caracteristics, Jc/B curves, fabrication
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Ключевые слова: HTS, YBCO, nucleation, MOD process, fluorine process, films epitaxial, substrate SrTiO3, fabrication
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Santoni A., Rondino F., Tortora L.
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Ключевые слова: HTS, Bi2212, thin films, MOD process, substrate SrTiO3, inkjet printing, microstructure, microwave devices, fabrication
Ключевые слова: HTS, YGdBCO, films, substrate sapphire, buffer layers, annealing process, TFA-MOD process, critical caracteristics, critical temperature, upper critical fields, irreversibility fields, temperature dependence, Jc/B curves, critical current density, angular dependence, self-field effect, experimental results
Ключевые слова: HTS, REBCO, coated conductors, mechanical properties, tensile tests, strain effects, GdBCO, RCE-CDR process, MOCVD process, MOD process, substrate Hastelloy, substrate Ni-W, substrate stainless steel, IBAD process, RABITS process, comparison, transverse stress, critical caracteristics, critical current, n-value, recovery characteristics, degradation studies, stabilizing layers, brass laminate, experimental results, electromechanical analysis
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